Measurement of the band offsets between amorphous LaAlO3 and silicon

By L. Edge, Darrell Schlom, S. Chambers, E. Cicerrella, J. Freeouf, B. Holländer, J. Schubert. 2004

156 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/20bcdef6d4a511d1ea3886868bcb722dbbfc9380