NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space

By H. Ade, A. Hitchcock. 2008

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Near Edge X-ray Absorption Fine Structure (NEXAFS) spectromicroscopy, resonant scattering and resonant reflectivity are specialized, synchrotron radiation based, soft X-ray characterization tools that provide moiety-specific contrast and either real-space imaging at ∼30 nm spatial resolution, or scattering signals which can be inverted to provide chemically sensitive information at an even higher spatial resolution (<5 nm). These X-ray techniques complement other real and reciprocal space characterization tools such as various microscopies and conventional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based tools, describe their present state-of-the-art and discuss a number of applications to exemplify their unique aspects.

Subfields: Atomic and Molecular Physics, and Optics, Radiation, Structural Biology

View Paper: https://www.semanticscholar.org/paper/1f8d747650e00e2be0820e1dd306b9f1727701b1