Determination of the Avogadro constant via the silicon route
By P. Becker, H. Bettin, H. Danzebrink, M. Gläser, U. Kuetgens, A. Nicolaus, D. Schiel, P. Bievre, S. Valkiers, P. Taylor. 2003
137 citations recorded by the source corpus.
Subfields: Organic Chemistry, Radiation, Statistics and Probability
View Paper: https://www.semanticscholar.org/paper/1eb1955a4b10b3182594f8efc5b495bdcc9e82fe
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Radiation
In Statistics and Probability
Citations in the corpus
- Improved measurement results for the Avogadro constant using a 28Si-enriched crystal (2015, background): “The subscript i refers to point defects, where βi is the strain coefficient [12, 36] and ΔNi is the concentration difference of the point-defect i between the sphere and the interferometer.”