Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films

By Jie Zhu, D. Tang, Wen Wang, Jun Liu, Kristopher W. Holub, Ronggui Yang. 2010

205 citations recorded by the source corpus.

Subfields: Civil and Structural Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/1e98704266689b35a83464e6133b93c41b834c1b

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Civil and Structural Engineering

1. Xiaokun Gu
2. Ronggui Yang
3. Xin Qian
4. Dongliang Zhao
5. S. Jajja
6. Baowen Li
7. Gang Chen

In Materials Chemistry

1. Xiaokun Gu
2. Ronggui Yang
3. Xin Qian
4. Dongliang Zhao
5. S. Jajja
6. Baowen Li
7. Xiaobo Yin
8. Yujie Wei

In Mechanics of Materials

1. Xin Qian
2. Dongliang Zhao
3. Ronggui Yang
4. Xiaokun Gu
5. S. Jajja

Citations in the corpus

• Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials (2016, methodology): “continuous wave (CW) lasers as shown in Figure 14b, which achieves similar accuracy to TDTR measurement for thermal conductivity of many thin-film materials [98,105,106,109].”