Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

By Chih-Tsung Tsai, T. Chang, Shih-Ching Chen, I. Lo, S. Tsao, Ming‐Chin Hung, Jiun-Jye Chang, Chen‐Yi Wu, Chun‐Yao Huang. 2010

164 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/1c5c0f5e2b9c2fe9e35fa53e9d0a1b758a1a2c61