THE SECONDARY ELECTRON YIELD OF TECHNICAL MATERIALS AND ITS VARIATION WITH SURFACE TREATMENTS

By V. Baglin, J. Bojko, O. Grobner, B. Henrist, N. Hilleret, C. Scheuerlein, M. Taborelli. 2000

201 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/1b104d40c06f3c24cc2dc0b5794072248c6eb251

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Citations in the corpus

• Sharp reduction of the secondary electron emission yield from grooved surfaces (2008, methodology): “Preprint submitted to Journal of Applied Physics November 25, 2007 beam conditioning and the use of rough or porous surfaces [5, 6 ,7,8].”