Dry matter accumulation predictors for optimal yield in soybean
By J. Board, Harikrishna Modali. 2005
83 citations recorded by the source corpus.
Subfields: Agronomy and Crop Science, Plant Science
View Paper: https://www.semanticscholar.org/paper/181b1f150ce8c68e44ba7b11bc93a8a02a3775e8
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In Agronomy and Crop Science
In Plant Science
Citations in the corpus
- Soybean Yield Formation: What Controls It and How It Can Be Improved (2011, background): “…is important in yield formation because yield components recognized as important in controlling yield on the environmental level [node m-2, reproductive node m-2 (node bearing a viable pod), pod m-2, and seed m-2] are responsive to TDM accumulation (Egli and Yu, 1991; Board and Modali, 2005).”
- Mechanisms Involved in Soybean Rust-Induced Yield Reduction (2008, methodology): “Total aboveground plant weights at R2 and R5 were estimated using empirical relationships between leaf weight and total plant dry matter at R2 and R5, respectively, which are based on data collected in fi eld studies performed in Louisiana over a 10-year period (Board and Modali, 2005).”
- Growth, Yield, and Yield Component Changes among Old and New Soybean Cultivars (2009, background): “Others have reported that TDM at R5 ( Board and Modali, 2005 ) and CGR (Egli and Zhen-wen, 1991) are closely linked to yield.”
- Growth and Yield Responses of Soybean to Row Spacing and Seeding Rate (2011, background): “Holshouser and Whittaker (2002) proposed a critical LAI value of 3.5 to 4.0 at the R5 stage for maximum light interception and yield, and Board and Modali (2005) proposed a critical threshold level of 600 g m−2 at the R5 Table 2.”