1.3 μm Submilliamp Threshold Quantum Dot Micro-lasers on Si
By Y. Wan, Justin C. Norman, Qiang Li, M. Kennedy, Di Liang, Chong Zhang, Duanni Huang, Zeyu Zhang, Alan Y. Liu, A. Torres and 5 more. 2017
136 citations recorded by the source corpus.
As a promising integration platform, silicon photonics need on-chip laser sources that dramatically improve capability, while trimming size and power dissipation in a cost-effective way for volume manufacturability. Currently, direct heteroepitaxial growth of III–V laser structures on Si using quantum dots as the active region is a vibrant field of research, with the potential to demonstrate low-cost, high-yield, long-lifetime, and high-temperature devices. Ongoing work is being conducted to reduce the power consumption, maximize the operating temperature, and switch from miscut Si substrates toward the so-called exact (001) Si substrates that are standard in microelectronics fabrication. Here, we demonstrate record-small electrically pumped micro-lasers epitaxially grown on industry standard (001) silicon substrates. Continuous-wave lasing up to 100°C was demonstrated at 1.3 μm communication wavelength. A submilliamp threshold of 0.6 mA was achieved for a micro-laser with a radius of 5 μm. The thresholds and footprints are orders of magnitude smaller than those previously reported lasers epitaxially grown on Si.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/17e2b1d355664d6e97af0d99c79ef93bcb37abc4
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- A Review of High-Performance Quantum Dot Lasers on Silicon (2019, methodology): “In devices with uid active regions, ultralow thresholds under 1 mA have been demonstrated on Si substrates by scaling to rings with radii of 4 μm [55].”