Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons

By M. Schubert. 2010

139 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/1777c87e8d75815b5c4b864d853ed956a6c970fa

Citations in the corpus

• Anisotropy, phonon modes, and free charge carrier parameters in monoclinic β-gallium oxide single crystals (2015, unknown): “In the generalized ellipsometry formalism, the interaction of electromagnetic plane waves with layered samples is described within the Jones or Mueller matrix formalism [47,48,76,77].”