Diffuse interface model for electromigration and stress voiding
By D. Bhate, Ashish Kumar, A. Bower. 2000
136 citations recorded by the source corpus.
Subfields: Aerospace Engineering, Computational Mechanics, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/15462b5bedecd5e38f1d5fdfd2cedcefae7cf39e
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Aerospace Engineering
In Computational Mechanics
In Materials Chemistry
- Bart Blanpain
- P. Wollants
- Nele Moelans
- Florin Bobaru
- Guanfeng Zhang
- Stewart A. Silling
- Ulisses M. Braga-Neto
- Levi D. McClenny
Citations in the corpus
- Why do cracks branch? A peridynamic investigation of dynamic brittle fracture (2015, background): “…the problems associated with numerically tracking the propagating discontinuity representing a crack, phase fieldmodels (seeAranson et al. 2000; Bhate et al. 2000; Bourdin et al. 2008; Pons and Karma2010; Spatschek et al. 2011;Bourdin et al. 2011; Borden et al. 2012), approximate the fracture…”
- An introduction to phase-field modeling of microstructure evolution (2008, methodology): “Besides solidification [1] and solid-state phase transformations [2], phase-field models are applied for simulating grain growth [3], dislocation dynamics [4–6], crack propagation [7,8], electromigration [9], solidstate sintering [10–12] and vesicle membranes in biological applications [13,14].”