Theoretical approaches to x-ray absorption fine structure
By J. Rehr, R. Albers. 2000
2,541 citations recorded by the source corpus.
Subfields: Materials Chemistry, Radiation, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/14d9ebf66f2fa6be90a69e2ab5d021a49f3a06c9
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In Materials Chemistry
- Evan Ma
- Yongqiang Q. Cheng
- Matthew Newville
- Mattias Klintenberg
- Yuntian Zhu
- R. Valiev
- Xiaolei Wu
- C. A. Schuh
In Radiation
In Surfaces, Coatings and Films
Citations in the corpus
- VESTA: a three-dimensional visualization system for electronic and structural analysis (2008, neutral): “41, 653–658 (1) Arai (2003); (2) CambridgeSoft (2008); (3) Palmer (2008); (4) Smith & Forester (1996); (5) Rehr & Albers (2000); (6) Dewhurst et al. (2005); (7) Yoshida (2000); (8) Blaha et al. (2001); (9) Minnesota Supercomputer Center (1993); (10) Mizuno (2002); (11) Kawamura (1996a); (12)…”
- Fundamentals of XAFS (2014, methodology): “Other useful treatments on a similar level can be found in other places(Stern, 1988; Rehr & Albers, 2000) as well.”
- Atomic-scale properties of Ni-based FCC ternary, and quaternary alloys (2015, positive): “The X-ray absorption fine structure spectrum for the NiCrCoFe HEA was calculated using ab-initio real space multiple scattering calculations (feff) as described in [23, 24, 25].”