Correlation of C1s chemical state intensities with the O1s intensity in the XPS analysis of anodically oxidized glass-like carbon samples

By S. Yumitori. 2000

307 citations recorded by the source corpus.

Subfields: Computational Mechanics, Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/13dfe0324c569f27602c2341afea3022d077a4ea

How researchers see this paper

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In Computational Mechanics

1. Rodney S. Ruoff

In Electrical and Electronic Engineering

1. Rodney S. Ruoff
2. R. Piner
3. Sungjin Park
4. S. Stankovich
5. M. Stoller
6. A. Velamakanni
7. Gaoquan Shi
8. Hui‐Ming Cheng

Citations in the corpus

• Chemical analysis of graphene oxide films after heat and chemical treatments by X-ray photoelectron and Micro-Raman spectroscopy (2009, background): “An attempt was made to fit the ‘‘expected’’ [11,12] peaks at 286.”