Modern developments in shear-stress measurement ☆

By J. Naughton, Mark Sheplak. 2002

413 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Electrical and Electronic Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/1337e09852d162970f67cadeb389a49a997dd25a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Chang-Jin Kim
  2. Joseph Katz
  3. Guang-Yi Sun
  4. J. Sheng
  5. Hyungmin Park
  6. E. Malkiel

In Electrical and Electronic Engineering

  1. Chang-Jin Kim
  2. Joseph Katz
  3. Guang-Yi Sun
  4. Woo-Tae Park
  5. J. Sheng
  6. Hyungmin Park
  7. E. Malkiel
  8. Frieder Mugele

In Mechanics of Materials

  1. Chang-Jin Kim
  2. Joseph Katz
  3. Guang-Yi Sun
  4. J. Sheng
  5. Hyungmin Park
  6. E. Malkiel

Citations in the corpus