Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures

By Yang Yang, M. White. 2000

197 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/110a56cfa4f07e3968b2601bf7b44dd8f55d1856

Citations in the corpus

• Overview of emerging nonvolatile memory technologies (2014, unknown): “temperature are problematic with shallow-level traps [48,77,78].”