Improved electron probe microanalysis of trace elements in quartz

By J. Donovan, H. Lowers, B. Rusk. 2011

138 citations recorded by the source corpus.

Subfields: Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/109e490c1f31d4fff525ed1be1a92de75ee30e1d

Citations in the corpus

• Quartz: Deposits, Mineralogy and Analytics (2012, unknown): “When improved background modeling, new quantitative ‘‘blank’’ correction routines and multiple spectrometers to improve the geometric efficiency are used, detection limits for Ti and Al as low as 2–3 ppm and 6–7 ppm can be achieved (Donovan et al. 2011).”