Power Cycle Testing of Power Switches: A Literature Survey
By Lakshmi GopiReddy, Leon M. Tolbert, Burak Ozpineci. IEEE transactions on power electronics, 2014
181 citations recorded by the source corpus.
Subfields: Control and Systems Engineering, Electrical and Electronic Engineering, Mechanical Engineering
View Paper: https://www.semanticscholar.org/paper/0d786ac55b03113325ac399b11044a9b79979785
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Control and Systems Engineering
- Frede Blaabjerg
- U. Choi
- Søren Jørgensen
- Xiongfei Wang
- Friedrich Wilhelm Fuchs
- Marco Liserre
- Nils Hoffmann
In Electrical and Electronic Engineering
- U. Choi
- Frede Blaabjerg
- Søren Jørgensen
- Xiongfei Wang
- Huai Wang
- Marco Liserre
- Friedrich Wilhelm Fuchs
- Yun Wei Li
In Mechanical Engineering
Citations in the corpus
- Review and analysis of SiC MOSFETs’ ruggedness and reliability (2020, background): “For example, bond-wire lift-off, or cracks can be concluded through a step change in Rds(on) during the test, and solder layer degradation can be evaluated by means of thermal impedance measurement [78].”
- Power Cycling Test Methods for Reliability Assessment of Power Device Modules in Respect to Temperature Stress (2018, methodology): “In [31], different PC test methods have been introduced.”