Multiparadigm modeling of dynamical crack propagation in silicon using a reactive force field.

By Markus J. Buehler, A. V. van Duin, William A. Goddard III. 2006

209 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

  1. James R. Kermode
  2. Gábor Csányi
  3. Peter Gumbsch
  4. E. Bitzek
  5. Noam Bernstein
  6. A. P. Bart'ok
  7. Markus J. Buehler
  8. Alexander V. Shapeev

In Electrical and Electronic Engineering

  1. James R. Kermode
  2. Peter Gumbsch
  3. E. Bitzek
  4. Markus J. Buehler
  5. Noam Bernstein
  6. A. P. Bart'ok
  7. Gábor Csányi
  8. Adri C. T. van Duin

In Materials Chemistry

  1. James R. Kermode
  2. Gábor Csányi
  3. Noam Bernstein
  4. A. P. Bart'ok
  5. E. Bitzek
  6. Peter Gumbsch
  7. Alexander V. Shapeev
  8. Adri C. T. van Duin

Citations in the corpus