Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy
By B. Knoll, F. Keilmann. 2000
461 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/0ce3f7cc6d1a553435e575de6b93d261f290f6bc
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In Atomic and Molecular Physics, and Optics
In Biomedical Engineering
In Electrical and Electronic Engineering
Citations in the corpus
- Near-field microscopy by elastic light scattering from a tip (2004, methodology): “Indeed small variations suffice to reverse the apparent near-field contrast, evidently by changing the background’s phase (Knoll & Keilmann 1999c, 2000a).”
- Plasmonic Laser Antennas and Related Devices (2008, methodology): “coated AFM tip can be modeled as a dipole interacting with its image in the underlying material [96].”
- Review of Near-Field Terahertz Measurement Methods and Their Applications (2011, methodology): “Using a quasi-electrostatic theory, Knoll and Keillman describe the interaction between a polarizable sphere (the tip) and its image inside the sample induced by the surface charges in the sample [39].”