Procedures and Practices for Evaluating Thin‐Film Solar Cell Stability

By R. Roesch, Tobias Faber, Elizabeth von Hauff, Thomas M. Brown, M. Lira-Cantú, Harald Hoppe. 2015

148 citations recorded by the source corpus.

During the last few decades, and in some cases only the last few years, novel thin‐film photovoltaic (PV) technologies such as dye‐sensitized solar cells (DSSC), organic solar cells (OPV), and, more recently, perovskite‐based solar cells (PSC) have been growing in maturity with respect to device performance and device stability. Together with new material systems, novel device architectures have also been introduced. Both parameters will have an effect on the overall device stability. In order to improve the understanding of degradation effects and how they can be prevented, stress testing under different conditions is commonly applied. By careful combination of stress factors and thorough analysis of photovoltaic parameter decaying curves, an understanding of the underlying degradation pathways can be gained. With the help of standardized and accelerated stress tests, as described in the ISOS‐protocols, statements concerning application lifetimes can finally be made and compared among different labs. Once a photovoltaic technology has proven long lasting durability, the ultimate barrier for entering the commercial market are the IEC tests, taking a deeper look on overall safety and reliability, not only on durability. Here, the most prominent stress tests are reviewed, discussed and extended with respect to learning the most about photovoltaic device stability.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0c6394743366bb15947efb0024b2052c1ba3b98b

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In Electrical and Electronic Engineering

1. Ashraf Uddin
2. Arafat Mahmud
3. Naveen Kumar Elumalai
4. Dian Wang

Citations in the corpus

• Perovskite Solar Cells: Progress and Advancements (2016, background): “Current products on the market typically have a warranty of 20–25 years (c-silicon solar cells), which suggest that the installation will retain 80% of its initial output after this time period, corresponding to a system loss of <1%/year [132].”