Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure

By A. Tataroğlu, Ş. Altındal, M. Bülbül. 2005

197 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0bbfd686e4dc5d1318af26e9f1f93889d04fe3ae