Quantitative force measurements using frequency modulation atomic force microscopy—theoretical foundations

By John E. Sader, T. Uchihashi, M. Higgins, Alan A. Farrell, Y. Nakayama, Suzanne P. Suzi Jarvis. 2005

140 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Statistics and Probability

View Paper: https://www.semanticscholar.org/paper/0b17003e37c1e2faeb75749aca3be339d079238c