Critical assessment of charge mobility extraction in FETs.

By Hyun Ho Choi, Kilwon Cho, C. Daniel Frisbie, Henning Sirringhaus, V. Podzorov. Nature Materials, 2017

636 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0b0e6ac79f38b67117601a9e0bf6c2045c6a5001