Electrical characterization of Al/MEH-PPV/p-Si Schottky diode by current-voltage and capacitance-voltage methods

By M. Aydin, Fahrettin Yakuphanoglu, Jae-Hoon Eom, D. Hwang. 2007

161 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0a2802abcb0a23a0fe11a49c06298be82107592b