Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

By O. Krivanek, M. Chisholm, V. Nicolosi, T. Pennycook, G. Corbin, N. Dellby, M. Murfitt, C. Own, Z. Szilagyi, M. Oxley and 2 more. Nature, 2010

1,263 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Structural Biology, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/090b224407c1fcb0768c51e63010a2cd65cc4e72

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In Electrical and Electronic Engineering

1. Dmitri Golberg
2. Yoshio Bando
3. Qiuming Peng
4. Chunyi Zhi
5. Frances M. Ross
6. Yadong Li
7. Dingsheng Wang
8. Xiaosheng Fang

Citations in the corpus

• Metal organic frameworks derived single atom catalysts for electrocatalytic energy conversion (2019, background): “Aberration-corrected high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) with atomic resolution can be employed for the direct observation of the metal single atoms distributed on the supports based on the different Z-contrast between the isolated metal species and t”
• Boron nitride nanotubes and nanosheets. (2010, positive): “and chemical analysis of BN monatomic sheets have nicely been demonstrated by Krivanek et al.(146) The au-”