De-embedding transmission line measurements for accurate modeling of IC designs

By A. Mangan, S. P. Voinigescu, Ming-Ta Yang, Mihai Tazlauanu. IEEE Transactions on Electron Devices, 2006

321 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/08ba8c22f10ecf5c42455f8ef27075a8e6e9da77