In situ analysis of trace elements in quartz by using laser ablation inductively coupled plasma mass spectrometry

By B. Flem, R. Larsen, A. Grimstvedt, J. Mansfeld. 2002

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The Preparation and Preliminary Characterisation of Three Synthetic Andesite Reference Glass Materials (ARM‐1, ARM‐2, ARM‐3) for In Situ Microanalysis (2019, methodology): “…LA-SF-ICP-MS was routinely used for multipleelement quantification with reduced sampling time and/or reduced mass range (Ødeg ard and Hamester 1997, Flem et al. 2002, Latkoczy and G€unther 2002, Tiepolo et al. 2003, Jochum et al. 2007, 2012, Regnery et al. 2010, Kimura and Chang 2012, Walle and…”
Recent developments in element concentration and isotope ratio analysis of individual fluid inclusions by laser ablation single and multiple collector ICP-MS (2012, background): “…for quartz-hosted inclusions, such a correction may not be significant for 849 many elements, results for Li, Ti, Al, B, Ga and Sn will be in excess without correction for host 850 quartz contribution (e.g., Flem et al., 2002; Landtwing and Pettke, 2005; Allan et al., 2007; 851 Rusk et al., 2011).”
Quartz: Deposits, Mineralogy and Analytics (2012, unknown): “In addition detailed information about structural impurities in quartz (Flem et al. 2002; Götze et al. 2004) are of interest since they may deﬁne the economic limits in purifying the raw quartz.”