X-ray diffraction: a powerful method of characterizing nanomaterials

By Ravi Sharma, D. P. Bisen, U. Shukla, B. Sharma. 2012

137 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/010ea242ece0f2e47c8154705d1d309820276817

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1. E. S. Ameh

Citations in the corpus

• A review of basic crystallography and x-ray diffraction applications (2019, methodology): “1) can be described by length of three axes (a, b, c) and the angles between the axes [5].”